Sensitivity of photodiode-based CMOS APS in 0.18um technology: peripheral collection and optimum dimension

TítuloSensitivity of photodiode-based CMOS APS in 0.18um technology: peripheral collection and optimum dimension
AutoresB. Blanco-Filgueira, P. López, D. Cabello, J. Ernst, H. Neubauer and J. Hauer
TipoComunicación para congreso
Fonte XXIII Conference on Design of Circuits and Integrated Systems, Grenoble (France), 2008.
ISBN978-2-84813-124-5

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